Improving nondestructive testing probe performance by digital processing techniques

IEEE Transactions on Instrumentation and Measurement

Volumn 52, Issue 3, 2003, Pages 959-965

  Bernieri, Andrea ^a   Betta, Giovanni ^a   Ferrigno, Luigi ^a  

^a UNIVERSITY OF CASSINO AND SOUTHERN LAZIO   (Italy)

Author keywords

Digital signal processing; Eddy current testing; Magnetic transducers; Nondestructive testing; Soft magnetic materials

Indexed keywords

ALGORITHMS; DIGITAL SIGNAL PROCESSING; ELECTRIC POTENTIAL; MAGNETIC MATERIALS; OPTIMIZATION; TRANSDUCERS;

MAGNETIC TRANSDUCERS;

EDDY CURRENT TESTING;

EID: 0041590989     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2003.814678     Document Type: Article

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