Tools and procedures for quantitative microbeam isotope ratio imaging by secondary ion mass spectrometry

Scanning

Volumn 25, Issue 4, 2003, Pages 165-174

  Gillen, Greg ^a   Bright, David ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Image processing; Isotope ratio; Isotope ratio imaging; Secondary ion imaging; Secondary ion mass spectrometry; Surface analysis

Indexed keywords

ALUMINUM; CALCIUM; IMAGE PROCESSING; ION BOMBARDMENT; ISOTOPES; SECONDARY ION MASS SPECTROMETRY;

ISOTOPIC IMAGES;

IMAGING TECHNIQUES;

ALUMINUM; CALCIUM; ION; MAGNESIUM; MINERAL;

ARTICLE; ASTRONOMY; COMPUTER PROGRAM; CORRELATION ANALYSIS; IMAGE PROCESSING; IMAGING SYSTEM; MASS SPECTROMETRY; MICROBEAM ISOTOPE RATIO IMAGING; MICROSCOPY; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS;

EID: 0041589655     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.4950250402     Document Type: Article

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