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Volumn 3, Issue , 2003, Pages 2117-2120

A scalable model for silicon spiral inductors

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC NOISE; ELECTRIC RESISTANCE; SILICON; SUBSTRATES;

EID: 0041589556     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (14)

References (5)
  • 1
    • 0032075292 scopus 로고    scopus 로고
    • On-chip spiral inductors with fattened ground shields for si-based RFIC's
    • May
    • C. P. Yue, and S. S. Wong, "On-Chip Spiral Inductors with Fattened Ground Shields for Si-Based RFIC's," IEEE J. Solid State Circuits, vol. 33, no. 5, pp. 743-752, May 1999.
    • (1999) IEEE J. Solid State Circuits , vol.33 , Issue.5 , pp. 743-752
    • Yue, C.P.1    Wong, S.S.2
  • 2
    • 0031103498 scopus 로고    scopus 로고
    • The modeling, characterization, and design of monolitic inductors for silicon RF IC's
    • March
    • J. R. Long, and M. A. Copeland, "The Modeling, Characterization, and Design of Monolitic Inductors for Silicon RF IC's," IEEE J. Solid State Circuits., vol. 32, no. 3, pp. 357-368, March 1997.
    • (1997) IEEE J. Solid State Circuits , vol.32 , Issue.3 , pp. 357-368
    • Long, J.R.1    Copeland, M.A.2
  • 3
    • 0033875648 scopus 로고    scopus 로고
    • Physical modeling of spiral inductors on silicon
    • March
    • C. P. Yue, and S. S. Wong, "Physical Modeling of Spiral Inductors on Silicon," IEEE Trans. On Electron Devices., vol. 47, no. 3, pp. 560-568, March 2000.
    • (2000) IEEE Trans. on Electron Devices. , vol.47 , Issue.3 , pp. 560-568
    • Yue, C.P.1    Wong, S.S.2
  • 4
    • 0027798939 scopus 로고
    • High-speed VLSI interconnect modeling based on S-parameter measurements
    • August
    • Y. Eo, and W. R. Eisenstadt, "High-Speed VLSI Interconnect Modeling Based on S-Parameter Measurements," IEEE Trans. On Components, Hybrids, and Manufacturing., vol. 16, no. 5, pp. 555-562, August 1993.
    • (1993) IEEE Trans. On Components, Hybrids, and Manufacturing , vol.16 , Issue.5 , pp. 555-562
    • Eo, Y.1    Eisenstadt, W.R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.