Estimation of the failure rate in a partially accelerated life test: A sequential approach

Stochastic Analysis and Applications

Volumn 21, Issue 4, 2003, Pages 909-915

  Tahir, Mohamed ^a  

^a UNITED ARAB EMIRATES UNIVERSITY   (United Arab Emirates)

Author keywords

Infinitesimal operator; Markov process; Partially accelerated life test; Posterior expected loss; Stopping time

Indexed keywords

EID: 0041571926     PISSN: 07362994     EISSN: None     Source Type: Journal    
DOI: 10.1081/SAP-120022869     Document Type: Article

References (6)

1. DeGroot, M.H.; Goel, P.K. Bayesian estimation and optimal designs in partially accelerated life testing. Naval Res. Logistics Quarterly 1979, 26, 223-235.
2. Bhattacharyya, G.H.; Soejoeti, Z. A tampered failure rate model for step-stress accelerated life test. Commun. Statist., Methods & Theory 1989, 18, 1627-1647.
3. Madi, M.T. Multiple step-stress accelerated life tests: the tampered failure rate model. Commun. Statist., Theory & Methods 1993, 22, 2631-2639.
4. Bhattacharyya, G.K. Parametric models and inference procedure for accelerated life test. Bulletin Int. Statist. Inst. 1987, 52, 145-162.
5. Dynkin, E.B. Markov Processes; Academic Press: New York, 1965; Vol. 1.
6. Tahir, M. A sequential test for the failure rate of an exponential distribution with censored data. Stoch. Anal. and Appl. 1992, 10, 239-250.