Scanning tunneling lithography of silicon nanoparticle films

European Physical Journal D

Volumn 24, Issue 1-3, 2003, Pages 347-349

  Scheier, P ^a   Sattler, K ^a  

^a UNIVERSITY OF HAWAII   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NANOPARTICLES; SCANNING TUNNELING MICROSCOPY; SILICON;

BI-LAYER; DISTRIBUTION OF PARTICLES; FISSION PROCESS; FUSION PROCESS; NANOPARTICLE FILMS; NARROW SIZE DISTRIBUTIONS; SCANNING TUNNELLING MICROSCOPY AND SPECTROSCOPY; SILICON NANOPARTICLES; TUNNELING RESISTANCE; WIDE-BAND-GAP;

ENERGY GAP;

EID: 0041570133     PISSN: 14346060     EISSN: None     Source Type: Journal    
DOI: 10.1140/epjd/e2003-00173-x     Document Type: Conference Paper

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