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Volumn 30, Issue 7, 1997, Pages 4415-4423

Bayesian reliability analysis using the dirichlet prior distribution with emphasis on accelerated life testing run in random order

Author keywords

Accelerated life testing; Bayesian inference; Design of experiment; Development testing; Dirichlet distribution; Multiple stress environment testing; Ordered reliabilities; Random ordering; Reliability growth

Indexed keywords


EID: 0041543814     PISSN: 0362546X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0362-546X(96)00120-4     Document Type: Article
Times cited : (14)

References (12)
  • 4
    • 0017747169 scopus 로고
    • A Bayesian note on reliability growth during a development testing program
    • Dec
    • Smith A. F. M., "A Bayesian Note on Reliability Growth During A Development Testing Program," IEEE Transactions on Reliability, Vol R-26, 1977 Dec, pp 346-347.
    • (1977) IEEE Transactions on Reliability , vol.R-26 , pp. 346-347
    • Smith, A.F.M.1
  • 5
    • 0023572512 scopus 로고
    • A Bays reliability growth model for a development testing program
    • Dec
    • Fard Nasser S. and Dietrich Duane L., "A Bays Reliability Growth Model for a Development Testing Program," IEEE Transactions on Reliability. Vol R-36, 1987 Dec, pp 568-572
    • (1987) IEEE Transactions on Reliability , vol.R-36 , pp. 568-572
    • Fard Nasser, S.1    Dietrich Duane, L.2
  • 6
    • 0027664378 scopus 로고
    • A Bayesian methodology for assessing product reliability during a development testing program
    • Sep
    • Mazzuchi Thomas A. and Soyer Refik, "A Bayesian Methodology for Assessing Product Reliability During a Development Testing Program," IEEE Transactions on Reliability, Vol 42, 1993 Sep, pp 503-510
    • (1993) IEEE Transactions on Reliability , vol.42 , pp. 503-510
    • Mazzuchi Thomas, A.1    Refik, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.