Principal component analysis method for two-phase flow concentration measurements

Qinghua Daxue Xuebao/Journal of Tsinghua University

Volumn 43, Issue 3, 2003, Pages 400-401+405

  Zhang, Yuchun ^a   Peng, Lihui ^a   Yao, Danya ^a   Zhang, Baofen ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

Artificial neural networks; Back propagation algorithm; Electrical capacitance tomography; Principal component analysis; Two phase flow

Indexed keywords

ARTIFICIAL INTELLIGENCE; CAPACITANCE; NEURAL NETWORKS; TOMOGRAPHY;

ARTIFICIAL NEURAL NETWORK; BACK PROPAGATION ALGORITHM; ELECTRICAL CAPACITANCE TOMOGRAPHY; PRINCIPAL COMPONENT ANALYSIS;

TWO PHASE FLOW;

EID: 0041530123     PISSN: 10000054     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (7)

1. LI Haiqing, ZHOU Zekui, ZHANG Hongjian, et al. Measurement and Applications of Two-phase Flow Parameters [M]. Zhejiang: Zhejiang University Press, 1991. (in Chinese)
2. ZHANG Yiheng. Modeling of Electrical Capacitance Tomography [D]. Beijing: Tsinghua University, 2000.
3. XIA Shaowei, YANG Jiaben. Panorama of Systems Engineering [M]. Beijing: Tsinghua University Press, 1995. (in Chinese)
4. ZHANG Yuchun, PENG Lihui, ZHANG Baofen, et al. Principal component analysis based concentration measuring for two-phase flow [A]. Proceedings of the 3rd International Symposium on Measurement Techniques for Multiphase Flows [C]. Japan: The Japanese Society for Multiphase Flow, 2001. 227-230.
5. ZOU Lu, ZHANG Yuchun, PENG Lihui, et al. Using principal component analysis to measure two-phase flow concentration [A]. Proceedings of 2nd World Congress on Industrial Process Tomography [C]. Hannover, Germany, 2001. 35-40.
6. Mohamad-Saleh J, Hoyle B S, Podd F J W, et al Direct flow process estimations from tomographic data using artificial neural systems [A]. Proceedings of 2nd World Congress on Industrial Process Tomography[C]. Hannover, Geramy, 2001. 751-758.
7. Mohamd-Saleh J, Hoyle B S, Podd F J W, et al. Direct process estimations from tomographic data using artificial neural systems [J]. Journal of Electronc Imaging, 2001, 10(3): 646-652.