Temperature Dependence of the Resistivity for Metal-Oxide Semiconductors Based on Tin Dioxide

Glass Physics and Chemistry

Volumn 29, Issue 4, 2003, Pages 422-427

  Kalinina, M V ^a   Moshnikov, V A ^b   Tikhonov, P A ^a   Tomaev, V V ^b   Mikhailichenko, S V ^b  

^a GREBENSHCHIKOV INSTITUTE OF SILICATE CHEMISTRY   (Russian Federation)

^b SAINT PETERSBURG ELECTROTECHNICAL UNIVERSITY LETI   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041522268     PISSN: 10876596     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1025189330183     Document Type: Conference Paper

References (15)

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