메뉴 건너뛰기




Volumn 34, Issue 3, 2003, Pages 187-191

Digital generation of surface of asymmetrical height distribution

Author keywords

Fractal; Plateau honing; Simulation of surface topography

Indexed keywords

COMPUTER AIDED DESIGN; FRACTALS; METALS; SURFACE CHEMISTRY;

EID: 0041509234     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0263-2241(03)00055-1     Document Type: Article
Times cited : (4)

References (9)
  • 1
    • 0042176809 scopus 로고
    • Rating criteria for the honing of cylinder running surfaces
    • Burscheid Issue, Hamburg, Germany
    • AE. Goetze, Rating criteria for the honing of cylinder running surfaces, AE-Goetze Honing Guide, Burscheid Issue, Hamburg, Germany, 1993.
    • (1993) AE-Goetze Honing Guide
  • 4
    • 0025414841 scopus 로고
    • Role of fractal geometry in roughness characterisation and contact mechanics of surfaces
    • Majumdar A., Bhushan B. Role of fractal geometry in roughness characterisation and contact mechanics of surfaces. J. Tribol. 4:1990;205-216.
    • (1990) J. Tribol. , vol.4 , pp. 205-216
    • Majumdar, A.1    Bhushan, B.2
  • 6
    • 0003788740 scopus 로고    scopus 로고
    • London: Imperial College Press
    • Thomas T.R. Rough Surfaces. 1999;Imperial College Press, London.
    • (1999) Rough Surfaces
    • Thomas, T.R.1
  • 7
    • 0042677979 scopus 로고
    • Problems of the measurement of standard of surface roughness parameters
    • Cairo
    • Jablonski J. Problems of the measurement of standard of surface roughness parameters. 4th Conf. of the Egyptian Society of Tribology, Cairo: 1995;271-279.
    • (1995) 4th Conf. of the Egyptian Society of Tribology , pp. 271-279
    • Jablonski, J.1
  • 9
    • 0041676088 scopus 로고    scopus 로고
    • Proposal of the mean value computation for roughness profile of asymmetrical height distribution
    • Vienna
    • Jablonski J. Proposal of the mean value computation for roughness profile of asymmetrical height distribution. 6th IMECO Symposium Metrology for Quality Control in Production, Vienna: 1998;271-276.
    • (1998) 6th IMECO Symposium Metrology for Quality Control in Production , pp. 271-276
    • Jablonski, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.