Nonlinear optical mapping of silicon carbide polytypes in 6H-SiC epilayers

Applied Physics Letters

Volumn 69, Issue 15, 1996, Pages 2243-2245

  Meyer, C ^a   Lupke G ^a   Stein Von Kamienski, E ^a   Golz A ^a   Kurz, H ^a  

^a RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041508146     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117141     Document Type: Article

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