Submicron hiati in acid-etched dentin are artifacts of desiccation

Dental Materials

Volumn 19, Issue 1, 2003, Pages 60-68

  Agee, Kelli L ^a   Pashley, Edna L ^a   Itthagarun, Anut ^b   Sano, Hidehiko ^c   Tay, Franklin R ^b   Pashley, David H ^a  

^a MEDICAL COLLEGE OF GEORGIA   (United States)

^b UNIVERSITY OF HONG KONG   (Hong Kong)

^c HOKKAIDO UNIVERSITY   (Japan)

Author keywords

Etched dentin; Hybrid layer; Nanoleakage; Silver staining; Submicron hiatus

Indexed keywords

ADHESIVES; COATINGS; COLLAGEN; ETCHING; TRANSMISSION ELECTRON MICROSCOPY;

HYBRID LAYERS;

DENTAL MATERIALS;

BISPHENOL A BIS(2 HYDROXYPROPYL) ETHER DIMETHACRYLATE; DENTIN BONDING AGENT; METHACRYLIC ACID DERIVATIVE; ONE STEP DENTIN BONDING SYSTEM; ONE UP BOND F; ONE-STEP DENTIN BONDING SYSTEM; ONE-UP-BOND F; PROMPT L POP; PROMPT L-POP; RESIN CEMENT; SINGLE BOND;

ARTICLE; ARTIFACT; CHEMISTRY; DENTAL ACID ETCHING; DENTIN; DESICCATION; ELECTRON MICROSCOPY; HISTOLOGY; POROSITY; SILVER STAINING; TOOTH DISEASE; ULTRASTRUCTURE;

ACID ETCHING, DENTAL; ARTIFACTS; BISPHENOL A-GLYCIDYL METHACRYLATE; DENTAL LEAKAGE; DENTIN; DENTIN-BONDING AGENTS; DESICCATION; HISTOCYTOLOGICAL PREPARATION TECHNIQUES; METHACRYLATES; MICROSCOPY, ELECTRON; POROSITY; RESIN CEMENTS; SILVER STAINING;

EID: 0041491390     PISSN: 01095641     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0109-5641(02)00007-6     Document Type: Article

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