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Physical Review Letters

Volumn 79, Issue 25, 1997, Pages 5038-5041

Low temperature sound velocity of thin SiO2 films

(5) Gaganidze, E a Konig R a Esquinazi, P b Zimmer, K c Burin, A d

a UNIVERSITY OF BAYREUTH (Germany)

b UNIVERSITY OF LEIPZIG (Germany)

c LEIBNIZ INSTITUTE OF SURFACE ENGINEERING IOM (Germany)

d CITY COLLEGE OF NEW YORK (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041486517 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.79.5038 Document Type: Article

Times cited : (6)

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