An empirical correlation for E(J, T) of a melt-cast-processed BSCCO-2212 superconductor under self field

IEEE Transactions on Applied Superconductivity

Volumn 13, Issue 2 II, 2003, Pages 2028-2031

  Cha, Y S ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Fault current limiters; Flux creep resistivity; Magnetic diffusion; Magnetic relaxation

Indexed keywords

CURRENT DENSITY; ELECTRIC FAULT CURRENTS; LIMITERS; MAGNETIC FLUX; MAGNETIC RELAXATION; SUPERCONDUCTIVITY; TEMPERATURE;

FLUX-CREEP RESISTIVITY;

SUPERCONDUCTING MATERIALS;

EID: 0041472198     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2003.812976     Document Type: Conference Paper

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