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Volumn , Issue , 2003, Pages 174-178
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Optimization of contact interface resistance for CMOS circuits
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM ALLOYS;
ELECTRIC CONTACTS;
ELECTRIC RESISTANCE;
INTERFACES (MATERIALS);
SCANNING ELECTRON MICROSCOPY;
SINTERING;
CONTACT INTERFACE RESISTANCE;
CMOS INTEGRATED CIRCUITS;
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EID: 0041438693
PISSN: 07496877
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (1)
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References (2)
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