Determination of Molecular Weight and Composition of a Perfluorinated Polymer from Fragment Intensities in Time-of-Flight Secondary Ion Mass Spectrometry

Analytical Chemistry

Volumn 62, Issue 19, 1990, Pages 2088-2092

  Fowler, David E ^a   Johnson, Robert D ^a   vanLeyen Dieter, ^b   Benninghoven, Alfred ^b  

^a IBM ALMADEN RESEARCH CENTER   (United States)

^b UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041429719     PISSN: 00032700     EISSN: 15206882     Source Type: Journal    
DOI: 10.1021/ac00218a008     Document Type: Article

References (13)

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8. Patton, J. D. E. I. du Pont de Nemours and Co., private communication, 1990.
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10. Secondary Ion Mass Spectrometry V; Benninghoven, A., Cotton, R. J., Simons, D. S., Werner, H. W., Eds.; Springer-Verlag: Berlin, 1986.
11. Fowler, D. E.; Johnson, R. D.; vanLeyen, D.; Benninghoven, A. Unpublished results.
12. Bletsos, I. V.; Fowler, D. E.; Hercules, D. M.; vanLeyen, D.; Benninghoven, A. Anal. Chem. 1990, 62, 1275-1284.
13. Bletsos, I. V.; Hercules, D. M.; Magill, J. H.; vanLeyen, D.; Nlehuis, E.; Benninghoven, A. Anal. Chem. 1988, 60, 938.