Materials science applications of a monochromated TEM

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 2, 2003, Pages 112-113

  Botton, G A ^a,b   Lazar, S ^a   Wu, M Y ^a   Tichelaar, F D ^a   Zandbergen, H W ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b MCMASTER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041422293     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927603440919     Document Type: Conference Paper

References (4)

1. P.C. Tiemeijer, J.H.A. van Lin, A.F. de Jong, Microscopy and Microanalysis 7, suppl 2 (2001), 1130-1131.
2. H.A. Brink, M. Barfels, B. Edwards, and P. Burgner, Microscopy and Microanalysis 7, Suppl. 2 (2001) 908-909.
3. S. Lazar, G.A. Botton, M.-Y. Wu, F.D. Tichelaar, H.W. Zandbergen, In Press, Ultramicroscopy, SALSA special issue, R.D. Leapman Editor.
4. G.A. Botton et al., In press, Electrochemical Society Proceedings, Paris 2003