Atom probe tomography characterization of multilayer films

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 2, 2003, Pages 574-575

  Thompson, G B ^a   Fraser, H L ^a   Miller, M K ^b  

^a Ohio State University   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041419942     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927603442876     Document Type: Conference Paper

References (2)

1. M.K. Miller, Atom Probe Tomography, Kluwer Academic/Plenum, New York, 2000.
2. D. J. Larson et al., Microscopy and Microanalysis, 7 (2001) 24.