Development, principles, and applications of automated ice fabric analyzers

Microscopy Research and Technique

Volumn 62, Issue 1, 2003, Pages 2-18

  Wilen, L A ^a   Diprinzio, C L ^a   Alley, R B ^b   Azuma, N ^c  

^a OHIO UNIVERSITY   (United States)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

^c NAGAOKA UNIVERSITY OF TECHNOLOGY   (Japan)

Author keywords

c axes; Fabric analysis; Ice fabric; Ice texture; Nearest neighbor correlation; Polygonization; Rigsby stage; Schmidt plot

Indexed keywords

AUTOMATION;

C-AXIS; FABRIC ANALYSIS; ICE FABRIC; ICE TEXTURE; NEAR-NEIGHBOR CORRELATION; NEAREST-NEIGHBOUR; POLYGONIZATION; RIGSBY STAGE; SCHMIDT; SCHMIDT PLOT;

ICE;

ICE; SILICON DIOXIDE;

ANALYTIC METHOD; AUTOANALYZER; CORRELATION COEFFICIENT; INSTRUMENTATION; OPTICS; PRIORITY JOURNAL; REVIEW; RIGSBY STAGE; ROCK; SCHMIDT PLOT; SURFACE PROPERTY;

EID: 0041419601     PISSN: 1059910X     EISSN: None     Source Type: Journal    
DOI: 10.1002/jemt.10380     Document Type: Review

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