Is SEM noise Gaussian?

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 2, 2003, Pages 982-983

  Prasad, M Satya ^a   Joy, David C ^b  

^a UNIVERSITY OF TENNESSEE   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041419541     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927603444917     Document Type: Conference Paper

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