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Volumn 9, Issue 4, 1991, Pages 2464-2468
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The mechanical properties and microstructure of plasma enhanced chemical vapor deposited silicon nitride thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0041414690
PISSN: 07342101
EISSN: 15208559
Source Type: Journal
DOI: 10.1116/1.577257 Document Type: Article |
Times cited : (97)
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References (21)
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