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Volumn 9, Issue 4, 1991, Pages 2464-2468

The mechanical properties and microstructure of plasma enhanced chemical vapor deposited silicon nitride thin films

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0041414690     PISSN: 07342101     EISSN: 15208559     Source Type: Journal    
DOI: 10.1116/1.577257     Document Type: Article
Times cited : (97)

References (21)
  • 3
    • 84953691916 scopus 로고    scopus 로고
    • W. C. Dautremont-Smith, R. A. Gottscho, and R. J. Shultz, in Semiconductor Materials and Process Technology Handbook for VLSI and ULSI, edited by G. E. McGuire (Noyes, Park Ridge, NJ, 1988), Chap. 5.
    • Dautremont-Smith, W.C.1    Gottscho, R.A.2    Shultz, R.J.3
  • 19
    • 84953691919 scopus 로고
    • edited by S. M Sze (McGraw-Hill, New York
    • A.C. Adams, in VLSI Technology, edited by S. M Sze (McGraw-Hill, New York, 1983), p. 120.
    • (1983) VLSI Technology , pp. 120
    • Adams, A.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.