Ultra-small-angle x-ray scattering and transmission electron microscopy studies probing grain size of lamellar styrene-butadiene block copolymers

ACS Symposium Series

Volumn 739, Issue , 1999, Pages 436-447

  Myers, Randall T ^a   Karbach, Alexander ^b   Bellare, Anuj ^c   Cohen, Robert E ^a  

^a USA   (United States)

^b Bayer AG   (Germany)

^c HARVARD MEDICAL SCHOOL   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041409870     PISSN: 00976156     EISSN: None     Source Type: Book Series    
DOI: 10.1021/bk-2000-0739.ch027     Document Type: Article

References (22)

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