UV- and γ-sensitization of latent tracks in polyethylene terephthalate

Radiation Measurements

Volumn 36, Issue 1-6 SPEC., 2003, Pages 131-135

  Vilensky, A I ^a   Zagorski, D L ^a   Kabanov, V Ya ^a   Mchedlishvili, B V ^a  

^a SHUBNIKOV INSTITUTE OF CRYSTALLOGRAPHY   (Russian Federation)

Author keywords

Atomic force microscopy; Infrared spectroscopy; Ion irradiated polymers; Liquid chromatography; Ultraviolet and sensitization

Indexed keywords

ATOMIC FORCE MICROSCOPY; DECOMPOSITION; DEFECTS; HEAVY IONS; HIGH PERFORMANCE LIQUID CHROMATOGRAPHY; PHOTOSENSITIVITY; POLYETHYLENE TEREPHTHALATES; RADIOLYSIS; ULTRAVIOLET RADIATION;

LATENT TRACKS;

ION BOMBARDMENT;

EID: 0041381047     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1350-4487(03)00109-4     Document Type: Conference Paper

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