Laser-based intense hard X-ray source for mammography

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5030 II, Issue , 2003, Pages 923-928

  Chen, L M ^a   Forget, P ^a   Toth, R ^a   Kieffer, J C ^a   Krol, A ^b   Chamberlain, C C ^b   Hou, B X ^c   Nees, J ^c   Mourou, G ^c  

^a INRS EMT   (Canada)

^b SUNY UPSTATE MEDICAL UNIVERSITY   (United States)

^c UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DOSIMETRY; LASER PULSES; LIGHT EMISSION; PHOTONS; X RAY ANALYSIS;

X-RAY SOURCES;

MAMMOGRAPHY;

EID: 0041374245     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.480178     Document Type: Conference Paper

References (29)

1. Z.Jiang, J.C.Kieffer, J.P.Matte, M.Chaker, O.Peyrusse, D.Gilles, G.Korn, A.Maksimchuk, S. Coe, G. Mourou, Phys. Plasma 2, 1702 (1995)
2. P. Gibbon, E. Forster, Plasma Phys. Control. Fusion, 38, 769 (1996)
3. U. Teubner et al, Phys. Rev. E, 54, 4167 (1996)
4. J.R. Davies, A.R. Bell, M. G. Haines, S.M. Guerin, Phys. Rev. E, 56,7193 (1997)
5. M. Tatarakis, J.R. Davies, P. Lee, P.A. Norreys, N. Kassapakis, F.N. Beg, M.G. Haines, A.E. Dangor, Phys. Rev. Lett. 81, 999, (1998)
6. K.B. Wharton et al, Phys. Rev. Lett. 81, 822 (1998)
7. M. Yoshida, et al, Appl. Phys. Lett., 73, 2393 (1998)
8. J. Yu, Z. Jiang, J.C. Kieffer, A. Krol, Phys. of Plasmas, 6, 1318 (1999)
9. S. Bastiani et al, Phys. Rev. E, 60, 3439 (1999)
10. Th. Schlegel et al, Phys. Rev. E, 60, 2209 (1999)
11. Ch. Reich, P. Gibbon, I. Uschmann, E. Forster, Phys. Rev. Lett. 84, 4846 (2000)
12. Z.M. Sheng, Y. Sentoku, K. Mima, J. Zhang, W. Yu, J. Meyer-ter-vehn, Phys. Rev. Lett. 85, 5340 (2000)
13. A. Zhidkov et al, Phys. Rev. E 62, 7232 (2000)
14. S. Hatchett et al, physics of plasmas, 7, 2076 (2000)
15. M. Schnurer, R. Nolte, A. Rousse, G. Grillon, G. Cheniaux, M.P. Kalachnikov, P.V. Nickles, W. Sanders, Phys. Rev. E 61, 4394 (2000)
16. K. Herrlin, G. Svahn, C. Olsson, H. Pettersson, C.Tillman, A. Persson, C-G. Wahlstrom, S. Svanberg, Radiology 189, 65 (1993).
17. C. Tillman, A. Persson, C. G. Wahlstrom, S. Svanberg, K. Herrlin, Appl. Phys. B, 61, 333 (1995)
18. C. Tillman, I. Mercer, S. Svanberg, K. Herrlin, JOSA B,134, 209 (1996)
19. C.P.J. Barty et al, SPIE proceedings, 2523, 286 (1995)
20. C.L.Gordon III, G.Y.Yin, B.E.Lemoff, P.M.Bell, C.P.J.Barty, Optics letters, 20, 1056 (1995)
21. A.Krol, A.Ikhlef, J.C.Kieffer, D.A.Bassano, C.Chamberlain, Z.Jiang, H.Pepin, S.Prassad, Med.Phys. 24 (5), 1997.
22. J. Yu, Z. Jiang, J.C. Kieffer, A. Krol, IEEE J. of selected topics in Qu. Electr. 5, 911 (1999)
23. J.C. Kieffer, A. Krol, Z. Jiang, C.C. Chamberlain, E. Scalzetti, Z. Ichalalene, Appl. Phys. B74, S75 (2002) and references therein.
24. A. Krol, Z. Jiang, Z. Ichalalene, J. C. Kieffer, C. Chamberlain, and E.M. Scalzetti, SPIE proceedings 3977, 331 (2000). Z. Ichalalence, Z. Jiang, J. C. Kieffer, F. Dorchies, A. Krol and C. Chamberlain, IEEE J. Sel. Top in Q. Electr. 7, 912 (2001)
25. A. Krol, Z. Jiang, Z. Ichalalene, J. C. Kieffer, C. Chamberlain, and E.M. Scalzetti, SPIE proceedings 3977, 331 (2000). Z. Ichalalence, Z. Jiang, J. C. Kieffer, F. Dorchies, A. Krol and C. Chamberlain, IEEE J. Sel. Top in Q. Electr. 7, 912 (2001)
26. M. Schnurer, P. V. Nickles, M. P. Kalashnikov, W. Sandner, R. Nolte, P. Ambrosi, J. L. Miquel, A. Dulieu and A. Jolas, J. Appl. Phys. 80, 5604(1996)
27. N. Takeyasu, Y. Hirakawa and T. Imasaka, Appl. Phys. Lett,78, 1195(2001) ; Rev. Sci. Instrum. 72, 3940(2001)
28. N. Takeyasu, Y. Hirakawa and T. Imasaka, Appl. Phys. Lett,78, 1195(2001) ; Rev. Sci. Instrum. 72, 3940(2001)
29. G. McCall, J. Phys. D. 15, 823(1982);