Waveguides based upon chalcogenide glasses

Journal of Optoelectronics and Advanced Materials

Volumn 3, Issue 2, 2001, Pages 367-372

  Balan, V ^a   Vigreux, C ^a   Pradel, A ^a   Ribes, M ^a  

^a UNIVERSITÉ DE MONTPELLIER   (France)

Author keywords

Astronomical interferometry; Chalcogenide thin layers; Etching; Integrated optics; IR waveguides; Optochemical sensors

Indexed keywords

AMMONIUM HYDROXIDE; ANTIMONY COMPOUNDS; ARSENIC COMPOUNDS; CHALCOGENIDES; CHEMICAL SENSORS; ETCHING; GERMANIUM COMPOUNDS; GLASS; INTEGRATED OPTICS; INTERFEROMETRY; REFRACTIVE INDEX; SELENIUM; SELENIUM COMPOUNDS; SILICON; SILICON COMPOUNDS; THERMAL EVAPORATION;

ASTRONOMICAL INTERFEROMETRY; CHALCOGENIDE GLASS; DETECTION OF POLLUTANT; HIGH REFRACTIVE INDEX; OPTOCHEMICAL SENSORS; SPATIAL INTERFEROMETRY; TECHNOLOGICAL APPLICATIONS; THIN LAYERS;

OPTICAL WAVEGUIDES;

EID: 0041350630     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (11)

1. A. B. Seddon, Journal of Non-Crystalline Solids, 184, 44-50 (1995).
2. T. V. Galstyan, J. F. Viens, A. Villeneuve, K. Richardson, M. A. Duguay, Journal of lightware technology, 15, 1343-1347 (1997).
3. K. Miura, J. Qiu, H. Inouye, T. Mitsuyu, K. Hirao, Applied Physics Letters, 71, 3329-3331 (1997)
4. Y. Mizushima, A. Yoshikawa, JARECT 16: Amorphous Semiconductor Technologies and Devices, 277 (1982)
5. V. K. Tikhomirov, Journal of Non-Crystalline Solids, 256-257, 328 (1999).
6. E. Laurent, I. Schanen, F. Malbet, G. Taillades, in Interferometry in Optical Astronomy, proc. SPIE, (2000).
7. E. Laurent, I. Schanen, P. Kern, A. Pradel, A. Aggad, proc. ICSO 2000, 497-505 (2000).
8. H. Nagai, A. Yoshikawa, Y. Toyoshima, O. Ochi, Y. Mizushima, Applied Physics Letters, 28(3), 145-147 (1976).
9. M. S. Chang. R. W. Hou, Optics Communications, 24(2), 220-224 (1978).
10. A. Yoshikawa, O. Ochi, Y. Mizushima, Applied Physics Letters, 36(1), 107-109 (1980).
11. K. L. Tai, R. G. Vadimsky, C. T. Kemmerer, J. S. Wagner, V. E. Lamberty, A. G. Timko, Journal of American Science Technology, 17(5), 1169-1176 (1980).