Defect levels and charge carrier photogeneration in amorphous selenium layers

Journal of Non-Crystalline Solids

Volumn 326-327, Issue , 2003, Pages 215-219

  Emelianova, E V ^a   Qamhieh, N ^b   Brinza, M ^a   Adriaenssens, G J ^a   Kasap, S O ^c   Johanson, R E ^c   Arkhipov, V I ^d  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b UNITED ARAB EMIRATES UNIVERSITY   (United Arab Emirates)

^c UNIVERSITY OF SASKATCHEWAN   (Canada)

^d IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CARRIER CONCENTRATION; CHARGE CARRIERS; ELECTRON TRAPS; IMAGING TECHNIQUES; MATHEMATICAL MODELS; SEMICONDUCTING SELENIUM;

FIELD FLUCTUATIONS;

NANOSTRUCTURED MATERIALS;

EID: 0041326728     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(03)00426-5     Document Type: Conference Paper

References (11)

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