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Volumn 355, Issue 3-4, 1996, Pages 252-253
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The analysis of conductive solid samples by r.f. capacitively coupled plasma at atmospheric pressure
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0041322224
PISSN: 09370633
EISSN: None
Source Type: Journal
DOI: 10.1007/s0021663550252 Document Type: Article |
Times cited : (10)
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References (4)
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