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Volumn 87, Issue 1, 1997, Pages 73-79

Influence of surface oxidation on the photoelectron diffraction intensities from InP single crystals

Author keywords

Elastic scattering; Overlayer thickness determination; Photoelectron diffraction

Indexed keywords


EID: 0041321970     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(97)00080-7     Document Type: Article
Times cited : (5)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.