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Volumn 87, Issue 1, 1997, Pages 73-79
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Influence of surface oxidation on the photoelectron diffraction intensities from InP single crystals
a a b b b |
Author keywords
Elastic scattering; Overlayer thickness determination; Photoelectron diffraction
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Indexed keywords
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EID: 0041321970
PISSN: 03682048
EISSN: None
Source Type: Journal
DOI: 10.1016/s0368-2048(97)00080-7 Document Type: Article |
Times cited : (5)
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References (7)
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