Wavelength-scanning interferometry of a transparent parallel plate with refractive-index dispersion

Applied Optics

Volumn 42, Issue 19, 2003, Pages 3888-3895

  Hibino, Kenichi ^a   Oreb, Bozenko F ^b   Fairman, Philip S ^b  

^a National Institute of Industrial Science and Technology   (Japan)

^b CSIRO   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ELECTROMAGNETIC DISPERSION; REFRACTIVE INDEX;

WAVELENGTH-SCANNING INTERFEROMETERS;

INTERFEROMETERS;

EID: 0041308122     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.42.003888     Document Type: Article

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