R.f. sputtering of high-quality Cu/In precursor layers and conversion to CuInS2 using elemental sulfidization processes

Journal of Materials Science: Materials in Electronics

Volumn 14, Issue 9, 2003, Pages 567-571

  Forbes, I ^a   Reddy, K T Ramakrishna ^a   Johnston, D ^a   Miles, R W ^a   Lane, D W ^b   Rogers, K D ^b   Chapman, A ^b  

^a NORTHUMBRIA UNIVERSITY   (United Kingdom)

^b CRANFIELD UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ARGON; COPPER COMPOUNDS; ENERGY DISPERSIVE SPECTROSCOPY; X RAY DIFFRACTION;

SULFIDIZATION;

THIN FILMS;

EID: 0041304976     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1024501919714     Document Type: Conference Paper

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