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Volumn 22, Issue 1-3, 1998, Pages 127-134

VPI-5 at 90°C: A synchrotron powder diffraction study

Author keywords

Aluminophosphate molecular sieve; Octahedral Al; Rietveld refinement; Solid state NMR; Symmetry transformation; Synchrotron radiation; VFI; VPI 5

Indexed keywords

ALUMINUM COMPOUNDS; CRYSTAL SYMMETRY; MOLECULAR STRUCTURE; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; PHASE TRANSITIONS; POROUS MATERIALS; SYNCHROTRON RADIATION; SYNTHESIS (CHEMICAL); X RAY POWDER DIFFRACTION;

EID: 0041193143     PISSN: 13871811     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1387-1811(98)00068-7     Document Type: Article
Times cited : (4)

References (19)
  • 4
    • 0040722858 scopus 로고    scopus 로고
    • J. De Oñate, L. McCusker, Ch. Baerlocher, unpublished work.
    • J. de Oñate, L. McCusker, Ch. Baerlocher, unpublished work.
  • 12
    • 0038944832 scopus 로고    scopus 로고
    • J. De Oñate, C. Falamaki, L.B. McCusker, Ch. Baerlocher, in preparation.
    • J. de Oñate, C. Falamaki, L.B. McCusker, Ch. Baerlocher, in preparation.
  • 13
    • 0003893314 scopus 로고
    • Institut für Kristallographie und Petrographie, ETH, Zurich
    • Ch. Baerlocher, X-ray Rietveld System XRS-82, Institut für Kristallographie und Petrographie, ETH, Zurich, 1982.
    • (1982) X-ray Rietveld System XRS-82
    • Baerlocher, Ch.1
  • 15
    • 0000752139 scopus 로고
    • in: R.A. Young (Ed.) Oxford University Press, Oxford
    • Ch. Baerlocher, in: R.A. Young (Ed.), The Rietveld Method, Oxford University Press, Oxford, 1993, p. 186.
    • (1993) The Rietveld Method , pp. 186
    • Baerlocher, Ch.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.