Atomic force microscopy study of the topographic evolution of polyacrylonitrile thin films submitted to a rapid thermal treatment

Thin Solid Films

Volumn 303, Issue 1-2, 1997, Pages 200-206

  Newton, P ^a   Houze F ^a   Guessab, S ^a   Noel S ^a   Boyer, L ^a   Lecayon G ^b   Viel, P ^b  

^a UNIV PARIS SUD   (France)

^b CEA SACLAY   (France)

Author keywords

Atomic force microscopy; Polyacrylonitrile thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROPOLYMERIZATION; HEAT TREATMENT; INFRARED SPECTROSCOPY; MELTING; MOLECULAR STRUCTURE; MORPHOLOGY; POLYACRYLONITRILES; SURFACE ROUGHNESS; SURFACE TREATMENT; THERMAL EFFECTS; THIN FILMS;

RAPID THERMAL TREATMENT; SURFACE TOPOGRAPHY;

PLASTIC FILMS;

EID: 0041163317     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00126-0     Document Type: Article

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