Characterizing the distribution of completion shapes with corners using a mixture of random processes

Pattern Recognition

Volumn 33, Issue 4, 2000, Pages 543-553

  Thornber, Karvel K ^a   Williams, Lance R ^a,b,c  

^a NEC LABORATORIES AMERICA   (United States)

^b University of New Mexico   (United States)

^c UNIVERSITY OF MASSACHUSETTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041161414     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0031-3203(99)00071-0     Document Type: Article

References (21)

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