Characterizing nanoparticles by scanning tunneling microscopy and scanning tunneling spectroscopy

Journal of Aerosol Science

Volumn 28, Issue SUPPL. 1, 1997, Pages

  Schmidt Ott, A ^a   Marsen, B ^b   Sattler, K ^b  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

^b UNIVERSITY OF HAWAII   (United States)

Author keywords

Nanoparticles; Scanning tunneling microscope; STM

Indexed keywords

EID: 0041159165     PISSN: 00218502     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0021-8502(97)85363-3     Document Type: Article

References (2)

1. Sattler, K. (1991) Z. Physik D - Atoms, Molecules and Clusters 19, 287.
2. Sattler, K., Raina, G., Ge, M., Venkateswaren, N., Xhie, J., Liao, Y.X., and Siegel, R.W. (1994) J. Appl. Phys. 76, 546