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Journal of Electron Spectroscopy and Related Phenomena

Volumn 79, Issue , 1996, Pages 495-498

Auger-electron-photoion coincidence studies on ionic fragmentation following the Si 2p ionization of SiF4

(7) Shigemasa, E a Hayaishib, T b Okuno, K c Danjo, A d Ueda, K e Sato, Y e Yagishita, A a

a HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK (Japan)

b UNIVERSITY OF TSUKUBA (Japan)

c TOKYO METROPOLITAN UNIVERSITY (Japan)

d NIIGATA UNIVERSITY (Japan)

e TOHOKU UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041134459 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/0368-2048(96)02903-9 Document Type: Article

Times cited : (7)

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