Study of submicron deposits in polycrystalline materials using the internal-friction method

Semiconductors

Volumn 31, Issue 7, 1997, Pages 714-715

  Andreev, Yu N ^a   Yaroslavtsev, N P ^a   Bestaev, M V ^b   Dimitrov, D Ts ^b   Moshnikov, V A ^b   Tairov, Yu M ^b  

^a VORONEZH STATE TECHNICAL UNIVERSITY   (Russian Federation)

^b SAINT PETERSBURG ELECTROTECHNICAL UNIVERSITY LETI   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041109055     PISSN: 10637826     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1187074     Document Type: Article

References (15)

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