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Volumn 3, Issue 2, 1996, Pages 1295-1303

Ab-initio studies of diffusion and growth phenomena on semiconductor surfaces

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EID: 0040987516     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X96002308     Document Type: Article
Times cited : (5)

References (61)
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    • note
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