National Institute of Standards and Technology - Texas Instruments Industrial Collaboratory Testbed

Microscopy and Microanalysis

Volumn 4, Issue 2 S, 1998, Pages 22-23

  Postek, Michael T ^a   Bennett, Marylyn ^a   Zaluzec, Nestor J ^b   Wheatley, Thomas ^c,d   Jones, Samuel ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b TEXAS INSTRUMENTS   (United States)

^c UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

^d ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040981388     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927600020237     Document Type: Article

References (4)

1. Contribution of the National Institute of Standards and Technology. Not subject to copyright.
2. N.J.Zaluzec Proceedings of 1995 Microscopy & Microanalysis Meeting, Kansas City. 1995 pg 14
3. Certain Commercial Equipment is identified in this report in order to adequately describe the experimental procedure. Such identification does not imply recommendation or endorsement by NIST, nor does it imply that the equipment identified is necessarily the best available for the purpose.
4. M.C. Wright et al., these proceedings