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Volumn 286, Issue 1, 2000, Pages 110-114

X-ray analysis and computer simulation for grain size determination in nanostructured materials

Author keywords

Nanostructured materials; Severe plastic deformation; X ray analysis

Indexed keywords

COMPUTER SIMULATION; DISLOCATIONS (CRYSTALS); GRAIN SIZE AND SHAPE; HIGH PRESSURE EFFECTS; PLASTIC DEFORMATION; X RAY CRYSTALLOGRAPHY;

EID: 0040952990     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(00)00652-3     Document Type: Article
Times cited : (12)

References (15)
  • 2
    • 0000526059 scopus 로고    scopus 로고
    • Ultrafine-grained materials produced by severe plastic deformation, special issue
    • Valiev R.Z. Ultrafine-grained materials produced by severe plastic deformation, special issue. Ann. Chim. Fr. 21:1996;369.
    • (1996) Ann. Chim. Fr. , vol.21 , pp. 369
    • Valiev, R.Z.1
  • 11
    • 0003472812 scopus 로고
    • New York: Dover Publishing
    • Warren B.E. X-Ray Diffraction. 1990;251 Dover Publishing, New York.
    • (1990) X-Ray Diffraction , pp. 251
    • Warren, B.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.