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Volumn 286, Issue 1, 2000, Pages 110-114
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X-ray analysis and computer simulation for grain size determination in nanostructured materials
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Author keywords
Nanostructured materials; Severe plastic deformation; X ray analysis
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Indexed keywords
COMPUTER SIMULATION;
DISLOCATIONS (CRYSTALS);
GRAIN SIZE AND SHAPE;
HIGH PRESSURE EFFECTS;
PLASTIC DEFORMATION;
X RAY CRYSTALLOGRAPHY;
SEVERE PLASTIC DEFORMATION;
NANOSTRUCTURED MATERIALS;
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EID: 0040952990
PISSN: 09215093
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-5093(00)00652-3 Document Type: Article |
Times cited : (12)
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References (15)
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