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Volumn 356, Issue 8, 1996, Pages 484-487
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Quantitative analysis of thin films of RBa2Cu3O7-x (R-rare earth elements) and ZrO2 (Y2O3) buffer layers by SNMS
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0040941158
PISSN: 16182642
EISSN: None
Source Type: Journal
DOI: 10.1007/s0021663560484 Document Type: Article |
Times cited : (5)
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References (7)
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