Interacting circular inclusions in antiplanepiezoelectricity

International Journal of Solids and Structures

Volumn 36, Issue 22, 1999, Pages 3349-3373

  Chao, C K ^a   Chang, K J ^a  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

Analytical continuation; Electromechanical loadings; Intelligent materials; Piezoelectric inclusions; Successive approximations

Indexed keywords

CRYSTAL DEFECTS; ELECTRIC FIELD EFFECTS; INCLUSIONS; INTELLIGENT MATERIALS; STRESS ANALYSIS;

ELECTROMECHANICAL LOADINGS; PIEZOELECTRIC INCLUSIONS;

PIEZOELECTRIC MATERIALS;

EID: 0040909183     PISSN: 00207683     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0020-7683(98)00148-6     Document Type: Article

References (11)

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