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Volumn 37, Issue 7, 1997, Pages 441-446

Charge-relaxation and dwell time in the fluctuating admittance of a chaotic cavity

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Indexed keywords


EID: 0040832710     PISSN: 02955075     EISSN: None     Source Type: Journal    
DOI: 10.1209/epl/i1997-00169-0     Document Type: Article
Times cited : (82)

References (31)
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