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Volumn 22, Issue 3, 1996, Pages 181-187

Should we move away from 'acceptable failure rate'?

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0040813981     PISSN: 13528769     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (1)

References (18)
  • 2
    • 0026261069 scopus 로고
    • The physical basis for the Roller Coaster hazard rate curve for electronics
    • Wong, KI, 'The physical basis for the Roller Coaster hazard rate curve for electronics', Quality and Reliability Engineering International 7, p489, 1991.
    • (1991) Quality and Reliability Engineering International , vol.7 , pp. 489
    • Wong, K.I.1
  • 5
    • 0025469262 scopus 로고
    • Reliability prediction: Help or hoax
    • O'Connor, PDT, 'Reliability prediction: help or hoax', Solid State Technology 33, p59, 1990.
    • (1990) Solid State Technology , vol.33 , pp. 59
    • O'Connor, P.D.T.1
  • 6
    • 0009809664 scopus 로고
    • A change in direction for reliability engineering is long overdue
    • Wong, KL, 'A change in direction for reliability engineering is long overdue', IEEE Trans. Reliability 42, p261, 1993.
    • (1993) IEEE Trans. Reliability , vol.42 , pp. 261
    • Wong, K.L.1
  • 8
    • 0028467726 scopus 로고
    • Predicting the reliability of electronic equipment
    • Pecht, MG and Nash, FR, 'Predicting the reliability of electronic equipment' Proc IEEE 82, No. 7, p992, 1994.
    • (1994) Proc IEEE , vol.82 , Issue.7 , pp. 992
    • Pecht, M.G.1    Nash, F.R.2
  • 11
    • 84947415803 scopus 로고
    • An analysis of some failure data
    • Davis, DJ, 'An analysis of some failure data', J Amer. Stat Assoc 47, No.0258, p113, 1952.
    • (1952) J Amer. Stat Assoc , vol.47 , Issue.258 , pp. 113
    • Davis, D.J.1
  • 16
    • 7044259565 scopus 로고
    • Lessons Learned from Experience
    • Bush, D, 'Lessons Learned from Experience', CODERM Newsletter 11, Nos 3&4, 1994.
    • (1994) CODERM Newsletter , vol.11 , Issue.3-4
    • Bush, D.1
  • 17
    • 0029196714 scopus 로고
    • Framework for a dual-use Reliability Program Standard
    • January Washington DC
    • Knowles, DI et al, 'Framework for a dual-use Reliability Program Standard' Proc Reliability and Maintainability Symposium, January 1995, Washington DC.
    • (1995) Proc Reliability and Maintainability Symposium
    • Knowles, D.I.1
  • 18
    • 7044275759 scopus 로고
    • Design-Reliability Assessment of Commercial Circuit Cards Based on Failure Mechanism Modelling
    • March Int Soc Science and Applied Technology
    • Stadterman, T et al, 'Design-Reliability Assessment of Commercial Circuit Cards Based on Failure Mechanism Modelling' Proc International Conference on Reliability and Quality Design, March 1995, Int Soc Science and Applied Technology.
    • (1995) Proc International Conference on Reliability and Quality Design
    • Stadterman, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.