![]() |
Volumn 98, Issue 1-3, 1998, Pages 1395-1399
|
Innovative plasma diagnostics and control of process in reactive low-temperature plasmas
a
c
SIEMENS AG
(Germany)
|
Author keywords
Low temperature plasmas; Plasma diagnostics
|
Indexed keywords
|
EID: 0040798397
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/S0257-8972(97)00261-2 Document Type: Article |
Times cited : (27)
|
References (14)
|