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Volumn 14, Issue 2, 1996, Pages 1344-1348

Scanning tunneling microscopy induced chemical-vapor deposition of semiconductor quantum dots

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0040765269     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589094     Document Type: Article
Times cited : (12)

References (19)
  • 12
    • 5544258078 scopus 로고    scopus 로고
    • note
    • Control electronics and software from RHK Technologies, Inc., Rochester Hills, MI.
  • 15
    • 5544288315 scopus 로고    scopus 로고
    • note
    • Product of Granville-Phillips, Corp.; pressure reading is calibrated for air.
  • 19
    • 5544320148 scopus 로고    scopus 로고
    • note
    • For example, local band bending in the sample and even possibly the tip (especially if it is coated with silicon or germanium) would tend to give larger than expected band-gap values.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.