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Volumn 51, Issue 5-6, 1996, Pages 560-564

Study of the location of implanted fluorine atoms in silicon and germanium through their nuclear quadrupole interactions

Author keywords

Electric field gradient; Electronic structure; Hartree Fock; Impurities; Semiconductors

Indexed keywords


EID: 0040750220     PISSN: 09320784     EISSN: None     Source Type: Journal    
DOI: 10.1515/zna-1996-5-634     Document Type: Article
Times cited : (2)

References (9)
  • 6
    • 0004133516 scopus 로고
    • Carnegie-Mellon Chemistry Publishing Unit, Pittsburgh, Pennsylvania
    • Gaussian 86, Carnegie-Mellon Chemistry Publishing Unit, Pittsburgh, Pennsylvania 1984.
    • (1984) Gaussian 86


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.