|
Volumn 51, Issue 5-6, 1996, Pages 560-564
|
Study of the location of implanted fluorine atoms in silicon and germanium through their nuclear quadrupole interactions
a a a a b b c |
Author keywords
Electric field gradient; Electronic structure; Hartree Fock; Impurities; Semiconductors
|
Indexed keywords
|
EID: 0040750220
PISSN: 09320784
EISSN: None
Source Type: Journal
DOI: 10.1515/zna-1996-5-634 Document Type: Article |
Times cited : (2)
|
References (9)
|