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Volumn 3226, Issue , 1997, Pages 204-213

Buried double p-n junction structure using a CMOS process for wavelength detection

Author keywords

Buried double p n junction; CMOS process; Silicon sensing devices; Wavelength detection

Indexed keywords

MICROELECTRONIC PROCESSING; MICROELECTRONICS; SEMICONDUCTOR JUNCTIONS;

EID: 0040716500     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.284570     Document Type: Conference Paper
Times cited : (6)

References (9)
  • 1
    • 0030106701 scopus 로고    scopus 로고
    • Colour detection using a buried double p-n junction structure implemented in the CMOS process
    • G. N. Lu, M. B. Chouikha, G. Sou and M. Sedjil, "Colour detection using a buried double p-n junction structure implemented in the CMOS process", Electron. Lett., Vol. 32, pp. 594-596, 1996
    • (1996) Electron. Lett , vol.32 , pp. 594-596
    • Lu, G.N.1    Chouikha, M.B.2    Sou, G.3    Sedjil, M.4
  • 2
    • 0014764318 scopus 로고
    • Charge coupled semiconductor devices
    • W. Boyle and G. Smith, "Charge coupled semiconductor devices", Bull Syst. Tech. J., Vol. 49, pp. 587-593, 1970
    • (1970) Bull Syst. Tech. J , vol.49 , pp. 587-593
    • Boyle, W.1    Smith, G.2
  • 3
    • 36149015973 scopus 로고
    • Intrinsic optical absorption in single-crystal germanium and silicon at 77°K and 300°K
    • W. C. Dash and R. Newman, "Intrinsic optical absorption in single-crystal germanium and silicon at 77°K and 300°K", Phys. Rev., Vol. 99, pp. 1151-1155, 1955
    • (1955) Phys. Rev , vol.99 , pp. 1151-1155
    • Dash, W.C.1    Newman, R.2
  • 4
    • 0001502281 scopus 로고
    • Analytic representation of the silicon absorption coefficient in the indirect transition region
    • J. Geist, A. Migdall and H.-P. Baites, "Analytic representation of the silicon absorption coefficient in the indirect transition region", Appl. Opt., Vol. 27, pp. 3777-3779, 1988
    • (1988) Appl. Opt , vol.27 , pp. 3777-3779
    • Geist, J.1    Migdall, A.2    Baites, H.-P.3
  • 7
    • 0018483291 scopus 로고
    • Reflectance of thinly oxidised silicon at normal incidence
    • T. Huen," Reflectance of thinly oxidised silicon at normal incidence", Appl. Opt., Vol. 18, pp. 1927-1932, 1979
    • (1979) Appl. Opt , vol.18 , pp. 1927-1932
    • Huen, T.1
  • 8
    • 0018518450 scopus 로고
    • Absorption coefficient of silicon for solar cell calculations
    • K. Rajkanan, R. Singh and J. Shewchun, "Absorption coefficient of silicon for solar cell calculations", Solid-St. Electronics, Vol. 22, pp. 793-795, 1979
    • (1979) Solid-St. Electronics , vol.22 , pp. 793-795
    • Rajkanan, K.1    Singh, R.2    Shewchun, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.