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Volumn 210, Issue 2, 1998, Pages 649-653
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Far-infrared spectroscopy of shallow acceptors in strained Ge/GeSi quantum well heterostrucrures
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0040676528
PISSN: 03701972
EISSN: None
Source Type: Journal
DOI: 10.1002/(SICI)1521-3951(199812)210:2<649::AID-PSSB649>3.0.CO;2-1 Document Type: Article |
Times cited : (4)
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References (14)
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