DX and Related Defects in Semiconductors

Semiconductors and Semimetals

Volumn 38, Issue C, 1993, Pages 235-291

  Malloy, Kevin J ^a   Khachaturyan, Ken ^b  

^a UNIVERSITY OF NEW MEXICO   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS IN SEMICONDUCTORS;

EID: 0040673035     PISSN: 00808784     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S0080-8784(08)62802-1     Document Type: Article

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