Anomalous temperature dependence of electrical resistivity in Pb0.8Sn0.2Te thin films

Thin Solid Films

Volumn 274, Issue 1-2, 1996, Pages 55-62

  Damodara Das, V ^a   Bahulayan, C ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

Adsorption; Electrical properties and measurements; Lead telluride; Resistivity

Indexed keywords

CHEMISORPTION; COOLING; DEPOSITION; ELECTRIC CONDUCTIVITY; ELECTRIC RESISTANCE MEASUREMENT; GRAIN SIZE AND SHAPE; LEAD COMPOUNDS; OXYGEN; SUBSTRATES; SURFACES; THERMAL EFFECTS; VACUUM APPLICATIONS;

CLASSICAL SIZE EFFECT; COOLING CYCLE; EFFECTIVE MEAN FREE PATH MODEL; FILM THICKNESS; GLASS SUBSTRATES; LEAD TIN TELLURIDE THIN FILMS; RECIPROCAL THICKNESS DEPENDENCE;

THIN FILMS;

EID: 0040652289     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)07092-3     Document Type: Article

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