Application of the pressure wave propagation method for adhesion defects detection and quantification in bilayer structures

Journal of Applied Physics

Volumn 86, Issue 2, 1999, Pages 1156-1166

  Aïnouche, Leïla ^a   Alquié, Claude ^a  

^a SORBONNE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040626326     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370859     Document Type: Article

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